American V-King Scientific Publishing
It is of great significance for technology analysists, technology policy makers and R&D managers to grasp technology front by applying information visualization technique via patent metric. Visualization analysis is widely applied in exploring scientific front, but seldom used in detecting technology front. In this paper, the author tries three visual analytic approaches to detecting technology front by using patent data retrieved from the authoritative patent database worldwide of Derwent Innovations Index (abbr. DII) in the field of global aerospace field in 2009.