Provided by: RS Publication
Date Added: Jul 2013
A new approach to adding Built-In Self Test (BIST) capabilities to integrated sigma-delta modulation RF transmitters is presented. An area efficient, all-digital building block generates multi-tone FM stimulus signals without compromising the performance of the RF transmitter itself. The RF signal is demodulated and digitized in an on-chip digital FM discriminator. Both blocks are fully testable using standard scan chain methods and consume a chip area of only 0.03 mm2in a 130 nm CMOS technology.