Automatic March Tests Generations for Static Linked Faults in SRAMs

Provided by: European Design and Automation Association
Topic: Storage
Format: PDF
Memories are one of the most important components in digital systems, and semiconductor memories are now-a-days one of the fastest growing technologies. Actually the major trend of System-on-Chip (SoC) allows to embed in a single chip all the components and functions that historically were placed on a hardware board. Static linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task.

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