Automation for Instrument Cluster Panel Testing Using Machine Vision and NI-PXI Hardware-in-the-Loop

Provided by: International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering (IJAREEIE)
Topic: Hardware
Format: PDF
In this paper, the authors proposed to develop automated instrument cluster panel testing and validation for shorten product development life cycle in automotive industry. The NI-PXI hardware-in-the-loop device combining with vision system is used for implementing closed loop automated Electronic Control Unit (ECU) testing. The LabVIEW NI-PXI system is simulating the real time hardwired and CAN signal for instrument cluster panel which is distributed by other ECUs in the vehicle network. The functionality result of concern test signal has been presented in the instrument cluster panel and the same signal has been captured by vision camera.

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