BIST for arrays of word organised RAMs

Download Now
Provided by: International Journals of Advanced Information Science and Technology (IJAIST)
Topic: Storage
Format: PDF
Transparent built in self-test for word oriented RAMs produces test data with high degree of symmetry. Transparent test approach is applied to the idle state of systems. Reducing the test time is very important for avoiding the interrupt of testing. Transparent word oriented March tests are directly obtained by repeatly executing the corresponding bit oriented March test on each bit of word. In this system RAMs are of different size are used and each has different width structure. Finally analyze the fault word by using RAM structure in online condition.
Download Now

Find By Topic