Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost Via Heterogeneous-Reliability Memory

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Provided by: Carnegie Mellon University
Topic: Storage
Format: PDF
Memory devices represent a key component of datacenter Total Cost of Ownership (TCO), and techniques used to reduce errors that occur on these devices increase this cost. Existing approaches to providing reliability for memory devices pessimistically treat all data as equally vulnerable to memory errors. The authors' key insight is that there exists a diverse spectrum of tolerance to memory errors in new data-intensive applications, and that traditional one-size-fits-all memory reliability techniques are inefficient in terms of cost.
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