University of Florence
Computer systems increasingly depend on exploiting program dynamic behavior to optimize performance, power and reliability. Prior studies have shown that program execution exhibits phase behavior in both performance and power domains. Reliability oriented program phase behavior, however, remains largely unexplored. As semiconductor transient faults emerge as a critical challenge to reliable system design, characterizing program phase behavior from a reliability perspective is crucial in order to apply dynamic fault-tolerant mechanisms and to optimize performance/reliability trade-offs.