European Design and Automation Association
In this paper, the authors present the results of their investigations into the reliability and uniqueness of Static Random Access Memories (SRAMs) in different technology nodes when used as a Physically Unclonable Function (PUF). The comparative analysis that can be found in this publication is the first ever of its kind, using different SRAM memories in technologies ranging from 180nm to 65nm. Each SRAM memory presents a unique and unpredictable start-up pattern when being powered up. In order to use an SRAM as a PUF in an application, the stability of its start-up patterns needs to be assured under a wide variety of conditions such as temperature and applied voltage.