Cross Entropy Minimization for Efficient Estimation of SRAM Failure Rate

Provided by: European Design and Automation Association
Topic: Storage
Format: PDF
As the semiconductor technology scales down to 45nm and below, process variations have a profound effect on SRAM cells and an urgent need is to develop fast statistical tools which can accurately estimate the extremely small failure probability of SRAM cells. In this paper, the authors adopt the Importance Sampling (IS) based information theory inspired minimum cross entropy method, to propose a general technique to quickly evaluate the failure probability of SRAM cells. In particular, they first mathematically formulate the failure of SRAM cells such that the concept of 'Cross entropy distance' can be leveraged, and the distance between the ideal distribution for IS and the practical distribution for IS (which is used for generating samples), is well-defined.

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