Custom On-Chip Sensors for Post-Silicon Failing Path Isolation in the Presence of Process Variations

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Provided by: European Design and Automation Association
Topic: Hardware
Format: PDF
In this paper, the authors offer a framework for predicting the delays of individual design paths at the post-silicon stage which is applicable to post-silicon validation and delay characterization. The prediction challenge is mainly due to limited access for direct delay measurement on the design paths after fabrication, combined with the high degree of variability in the process and environmental factors. Their framework is based on using on-chip delay sensors to improve timing prediction. Given a placed netlist at the pre-silicon stage, an optimization procedure is described which automatically generates the sensors subject to an area budget and available whitespace on the layout, in the presence of process variations.
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