Cycle Time Forecasting Models for Defect Inspection Process in TFT-LCD Module Assembly

Provided by: National Kaohsiung First University of Science and Technology
Topic: Hardware
Format: PDF
Because most of the procedures in defect inspection process of TFT-LCD module assembly are examined manually through human vision, cycle time estimation for this particular process is complicated and usually deviated from actual observations considerably in practice. Hence, this paper would like to apply the approaches of Bayesian network, linear discriminate analysis, and logistic regression to develop reliable prediction models for defect inspection cycle time. Potential explanatory variables like work-in-process, throughput, yield, and number of product mixes are considered for model construction.

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