DARA: A Low-Cost Reliable Architecture Based on Unhardened Devices and Its Case Study of Radiation Stress Test

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Provided by: Institute of Electrical & Electronic Engineers
Topic: Hardware
Format: PDF
A microprocessor with an architectural redundancy to achieve high dependability is designed and manufactured to explore the effectiveness of tolerating soft errors without circuit hardening. The processor architecture is based on a modularized pipeline which contains several functionalities to facilitate a real-time error detection and a fast roll-back recovery. As a further extension for a possible increase of hard errors in the future technology, an energy-effective coverage of hard errors by dynamically adapting the redundancy between a dual and a triple module is also included in the processor.
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