Provided by: International Journal of Advances in Engineering & Technology (IJAET)
Date Added: May 2012
Artificial Neural Network (ANN) plays a vital role in VLSI circuits for diagnosing the faults in digital circuits. In this paper, a method for diagnosing the multiple faults in VLSI circuits using ANN is proposed. First, the test pattern generation method injects the faults into the logic element of IEEE benchmark circuits. Second, injected faults are diagnosed using the ANN namely MLP, BPN and ART. And it's implemented on FPGA. The simulation result is obtained with ModelSim ISE SC 6.2C software.