International Journal of Research In Advanced Engineering Technologies (IJRAET)
Silicon Physical Unclonable Functions (PUFs) utilize the variation during silicon fabrication process to extract information that will be unique for each chip. There have been many recent approaches to how PUF can be used to improve security related applications. However, it is well-known that the fabrication variation has very strong spatial correlation and this has been pointed out as a security threat to silicon PUF. In fact, when the authors apply NIST's statistical test suite for randomness against the random sequences generated from a population of 125 Ring Oscillator (RO) PUFs using classic 1-out-of-8 coding and neighbor coding, none of them can pass all the tests.