Design Fault Directed Test Generation for Microprocessor Validation

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Provided by: edaa
Topic: Hardware
Format: PDF
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher potential to find faults in the design. The authors propose a model based test generation framework that generates tests for design fault classes inspired from software validation. There are two main contributions in this paper. Firstly, they propose a microprocessor modeling and test generation framework that generates test suites to satisfy Modified Condition Decision Coverage (MCDC), a structural coverage metric that detects most of the classified design faults as well as the remaining faults not covered by MCDC.
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