Design Of Cost Efficient Memory Using Advanced Error Correction Method

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Provided by: Foundation for Interdisciplinary Research in Engineering (FIRE)
Topic: Storage
Format: PDF
Faults in the memory generally tested by comparing faulty circuits with test circuits. Due to this testing process cost of memory is increasing. To reduce testing cost prefect error correcting method is required. A methodology existing here is called a matrix code, combines hamming and parity code to assure the improvement of reliability and yield of the memory chip in the presence of high defects. The method is evaluated using fault injection experiments. The result are compared to well-known technique such as reed-muller and hamming code.
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