Institute of Electrical & Electronic Engineers
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerbate process variations and reduce noise margins, worst case design will eventually fail to meet an aggressive combination of objectives in performance, reliability and power. In order to circumvent these difficulties, researchers have recently proposed a new design paradigm: self-calibrating circuits. Design parameters (e.g., operating points) of self-calibrating circuits are set by monitoring correctness of their operation, thus enabling to dynamically trade reliability for power or performance, depending on actual silicon capabilities and noise conditions.