Diagnosis of Resistive-Open Defects using IDDT in Digital CMOS Circuits

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Provided by: WSEAS
Topic: Hardware
Format: PDF
A resistive-open defect is an imperfect circuit connection that can be modeled as a defect resistor between two circuit nodes that should be connected. Resistive-open defects will not cause function fault immediately, but it will cause the delay fault, and cannot use the method of voltage to survey. In this paper, the authors propose a test method of transient power supply current (IDDT) for resistive open faults, and use wavelet analysis to location the fault. The experimental results show that the effectiveness of IDDT methods uses the RMS values of the wavelet transforms of the transient power supply or ground currents.
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