International Journal of Engineering Trends and Technology
Automatic Test Equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), using automation to quickly perform measurements and evaluate the test results. The IC Testing is done by thorough understanding of data sheets of respective IC's and proper test plan is made. Now the Test plan is executed and the results are noted and are compared with the original values given in the data sheet. The IC (DUT) is tested for different inputs which cover all its functionalities and the respective outputs are noted and compared by the ATE using the given original IC specifications.