Dynamic Test Input Generation for Database Applications to Achieve High Mutation Score

Provided by: Iowa State University
Topic: Big Data
Format: PDF
Automatic generation of test cases for database applications has attracted researchers from both academia and industry. Typically in database application, the quality of test cases for the host language (e.g., Java) is evaluated on the basis of the number of lines, statements and blocks covered by the test cases, whereas, the quality of test cases for the embedded language (e.g., SQL) is evaluated using mutation testing. In mutation testing, several mutants or variants of the original SQL query are generated and the mutation score is calculated.

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