E-RoC: Embedded RAIDs-on-Chip for Low Power Distributed Dynamically Managed Reliable Memories
The dual effects of larger die sizes and technology scaling, combined with aggressive voltage scaling for power reduction, increase the error rates for on-chip memories. Traditional on-chip memory reliability techniques (e.g., ECC) incur significant power and performance overheads. In this paper, the authors propose a low-power-and-performance-overhead Embedded RAID (E-RAID) strategy and present Embedded RAIDs-on-Chip (E-RoC), a distributed dynamically managed reliable memory subsystem. E-RoC achieves reliability through redundancy by optimizing RAID-like policies tuned for on-chip distributed memories. They achieve on-chip reliability of memories through the use of distributed Dynamic Scratch Pad Allocatable Memories (DSPAMs) and their allocation policies.