The dual effects of larger die sizes and technology scaling, combined with aggressive voltage scaling for power reduction, increase the error rates for on-chip memories. Traditional on-chip memory reliability techniques (e.g., ECC) incur significant power and performance overheads. In this paper, the authors propose a low-power-and-performance-overhead Embedded RAID (E-RAID) strategy and present Embedded RAIDs-on-Chip (E-RoC), a distributed dynamically managed reliable memory subsystem. E-RoC achieves reliability through redundancy by optimizing RAID-like policies tuned for on-chip distributed memories. They achieve on-chip reliability of memories through the use of distributed Dynamic Scratch Pad Allocatable Memories (DSPAMs) and their allocation policies.