European Design and Automation Association
The efficiency of different assist techniques for SRAM cell functionality improvement under the influence of random process variation is studied in this paper. The sensitivity of an SRAM cell functionality metrics when using control voltage level assist techniques is analyzed in read and write operation modes. The efficiency of the assist techniques is estimated by means of parametric analysis. The purpose is to find the degree of functionality metric improvement in each operation mode. The acceptance region concept is used for parametric analysis of SRAM cell functionality under random threshold voltage variations.