Efficient Fault-Handling of Reconfigurable Logic in SRAM using BIST and AGT

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Provided by: International Journal of Advanced Research in Computer and Communication Engineering (IJARCCE)
Topic: Storage
Format: PDF
Fault tolerance is an important system metric for many operating environments. The conventional technique for improving system reliability is by replicating component, which uses the parameter such as cost, high design time, testing, consumption of power, volume. The proposed approach employs Adaptive group testing technique for stuck open fault and stuck short fault resolution. The Static Random Access Memory (SRAM) circuit is tested for its functionality. LFSR is used for generating the test patterns. These patterns are provided to circuit to check its functionality.
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