Institute of Electrical & Electronic Engineers
As technology feature sizes shrink, aggressive voltage scaling is required to contain power density. However, this also increases the rate of transient upsets - potentially preventing the user from scaling down voltage and possibly even requiring voltage increases to maintain reliability. Duplication with checking and triple-modular redundancy are traditional approaches to combat transient errors, but spending 2-3x the energy for redundant computation can diminish or reverse the benefits of voltage scaling. As an alternative, the authors explore the opportunity to use checking computations that are cheaper than the base computation they are guarding.