Institute of Electrical & Electronic Engineers
In current broadband MIMO-OFDM systems such as 3GPP LTE, embedded buffering memories occupy a large portion of chip area and a significant amount of power consumption. Due to the dense structure of memories, they are especially vulnerable to scaling effects such as process variation. These effects (hardware errors) become more pronounced when aggressive voltage scaling is used due to the reduced voltage overhead. To address this issue, the authors present an error resilient MIMO detector. First, they derive a combined distribution of the received data in a MIMO-OFDM receiver that includes both the noise incurred by the wireless channel and errors introduced at the receiver buffering memory due to aggressive voltage scaling.