Exploration Electromagnetic Noise Reduction for IC Electric Field Measurement and Prediction in GTEM Cell

Provided by: The International Journals of Engineering & Sciences (IJENS)
Topic: Hardware
Format: PDF
In IEC 61967 standards, there is often interest to evaluate electromagnetic emission of Integrated Circuits (ICs) by mounting IC test board on TEM/GTEM cell wall. The method is able to separate the desired emission measurement to be influenced by unintentional interference. However, this method has limited test device rotation in horizontal position as well as neglecting vertical polarization which is also a significant source of emission. Basically, the electromagnetic emission of a device is contributed by both the horizontal and vertical polarizations. The limitation can be overcome with three dimensional views as termed to be three orthogonal rotations in Gigahertz Transverse Electromagnetic Mode (GTEM).

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