Fault Detection and Correction Using MLD for Memory Applications

Provided by: IT Society of India (ITSI)
Topic: Hardware
Format: PDF
In this paper, the authors propose an error detection mechanism with majority logic decoding and a novel Test Pattern Generator (TPG) for built-in self-test. The majority logic decodable codes can correct a large number of errors and they are suitable for memory applications. Their method reduces the memory access time. The reason for using ML decoding is that it is very simple to implement and thus, it is very practical and has low complexity. The TPG generates Multiple Single Input Change (MSIC) vectors in a pattern.

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