Provided by: IJAERT
Date Added: Nov 2014
Several approaches for the diagnosis of faults in analog circuits have reasonably accuracy which comes at the cost of heavier processing requirements and lowered efficiencies. In this paper, the authors propose a time domain based technique for fault diagnosis using specifications extracted from the step response of a circuit. With the help of neural network, they have to go for back propagation learning phase and all the simulated results from multi-sim simulation i.e. node voltages of the circuit.