Fault Models for Embedded-DRAM Macros

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Provided by: Association for Computing Machinery
Topic: Storage
Format: PDF
In this paper, the authors compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. They start from an standard SRAM test algorithm and discuss the faults which are not covered in the SRAM testing but should be considered in the DRAM testing. Then, they study the behavior of those faults and the tests which can detect them. Also, they discuss how likely each modeled fault may occur on eDRAMs and commodity DRAMs, respectively.
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