Delft University of Technology
In this paper the authors introduce a fine-grain fault diagnosis approach for reconfigurable logic blocks. As opposed to previous papers, they propose to reuse rather than to discard defective blocks. They describe methods to analyze deeper a defective Xilinx Virtex2Pro slice and diagnose the fault, out of a set of 150, that causes the malfunction. The outcome of the fault diagnosis is subsequently used to characterize the defective slice functionality and then match it with a suitable design configuration. The proposed methods are implemented and prototyped in a Virtex2Pro-30.