International Journal of Information and Electronics Engineering
As technology is continuously scaling down leakage current is increasing exponentially. Multi-threshold CMOS technique is a well-known way to reduce leakage current but it gives rise to a new problem i.e. ground bounce noise which reduces the reliability of the circuit and because of this circuit may incorrectly switch to the wrong value or may switch at the wrong time. Ground bouncing noise produced during sleep to active mode transitions is an important challenge in Multi-Threshold CMOS (MTCMOS) circuits.