International Journal of Advanced Research in Computer Science and Software Engineering (IJARCSSE)
Leakage power dissipation has become major portion of total power consumption in the integrated device and is expected to grow exponentially in the next decade as per International Technology Roadmap for Semiconductors (ITRS). This directly affects the battery operated devices as it has long idle times. Thus by scaling down the threshold voltage has tremendously increased the sub threshold leakage current thereby making the static power dissipation very high. To overcome this problem several techniques has been proposed to overcome this high leakage power dissipation.