Improving Yield and Reliability of Chip Multiprocessors

Provided by: edaa
Topic: Hardware
Format: PDF
An increasing number of hardware failures can be attributed to device reliability problems that cause partial system failure or shutdown. In this paper the authors propose a scheme for improving reliability of a homogeneous Chip Multi-Processor (CMP) that also serves to improve manufacturing yield. Their solution centers on exploiting the natural redundancy that already exists in multi-core systems by using services from the other cores for functional units that are defective in a faulty core.

Find By Topic