InVerS: An Incremental Verification System with Circuit Similarity Metrics and Error Visualization

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Provided by: University of Michigan
Topic: Hardware
Format: PDF
Dramatic increases in design complexity and advances in IC manufacturing technology affect all aspects of circuit performance and functional correctness. As interconnect increasingly dominates delay and power at the latest technology nodes, much effort is invested in physical synthesis optimizations, posing great challenges in validating the correctness of such optimizations. Common design methodology delays the verification of physical synthesis transformations until the completion of the design phase. However, this approach is not sustainable because the isolation of potential errors becomes extremely challenging in current complex design efforts.
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