IVF: Characterizing the Vulnerability of Microprocessor Structures to Intermittent Faults

Provided by: edaa
Topic: Hardware
Format: PDF
With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively characterizing the vulnerability of microprocessor structures to intermittent faults at early design stage is significantly helpful to balance system performance and reliability. Prior researches have proposed several metrics to characterize the vulnerability of microprocessor structures to soft errors and permanent faults, however, the vulnerability of these structures to intermittent faults are still rarely considered. In this paper, the authors propose a metric Intermittent Vulnerability Factor (IVF) to characterize the vulnerability of microprocessor structures to intermittent faults.

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