Leveraging 3D Technology for Improved Reliability

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Provided by: The University of Tulsa
Topic: Hardware
Format: PDF
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower supply voltages have increased the vulnerability of computer systems towards transient faults. An increase in within-die and die-to-die parameter variations has also led to a greater number of dynamic timing errors. A potential solution to mitigate the impact of such errors is redundancy via an in-order checker processor. Emerging 3D chip technology promises increased processor performance as well as reduced power consumption because of shorter on-chip wires.
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