Memory Debug Using BIST

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Provided by: International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE)
Topic: Hardware
Format: PDF
Built-In-Self-Test (BIST) is best tested in embedded memories such as RAMs and ROMs. The use of BIST is for manufacturing or production testing with additional features for diagnostics and debug .This paper present a study on memory debug methodology using BIST in System-On-Chip (SOC) product development and yield ramp-up and describes diagnosis techniques during rapid development of semiconductor memories for catching the design and manufacturing failures and improving overall yield and quality. It also covers MARCH based memory diagnosis algorithm which locate fault cells also identified their types, using the proposed algorithm stuck-at-faults, state coupling faults, transition faults can be distinguished.
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