Micro Data Handling for nm Range Semiconductor Device Using High Resolution ADC

Provided by: International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering (IJAREEIE)
Topic: Hardware
Format: PDF
In VLSI technology, devices are fabricated using semiconductor materials like Si and GaAs have been scaled down in nm range. The proposed paper aims at measuring voltage and data logging application with real time facility. This will help to understand the characteristics of nm range devices. The paper will also focus on nm sensors and devices testing. The proposed paper will use resistive method. This method is a linear and accurate for measuring current. In this, resister is inserted in series with the current path and the voltage drop across it measured.

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