Modeling and Analyzing the Effect of Microarchitecture Design Parameters on Microprocessor Soft Error Vulnerability

Provided by: University of Florence
Topic: Hardware
Format: PDF
High performance and reliability are essential for microprocessor design. As semiconductor processing technology continues to move toward smaller and denser transistors, lower threshold voltages and tighter noise margins, microprocessors are becoming more susceptible to transient faults that can affect reliability. The increasing chip soft error rates make it is necessary to estimate process transient fault susceptibility at the microarchitecture design stage. Therefore, it becomes important to understand and to evaluate the implications of design choices and optimizations from both performance and reliability perspectives.

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