New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

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Provided by: Creative Commons
Topic: Hardware
Format: PDF
In this paper, the authors focused on non-linear analog circuits, with the special attention paid to circuits comprising bi-polar and MOS transistors manufactured in micrometer and sub-micrometer technology. The problem of fault diagnosis of this class of circuits is discussed, including locating faulty elements and evaluating their parameters. The paper deals with multiple parametric fault diagnosis using the simulation after test approach as well as detection and location of single catastrophic faults, using the simulation before test approach.
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