On Modeling the Lifetime Reliability of Homogeneous Manycore Systems

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Provided by: The China Press Berhad
Topic: Hardware
Format: PDF
While the relentless scaling of CMOS technology has brought with it enhanced functionality and improved performance in every new generation, the associated ever-increasing on-chip power and temperature densities make the lifetime reliability of high-performance Integrated Circuits (ICs) one of the major concerns for the industry. Advancements in technology enable integration of a large number of cores on a single silicon die. At the same time, aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of such large integrated circuits.
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