Association for Computing Machinery
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of manufacturing test. Pseudo functional testing tries to resolve this problem by identifying illegal states in functional mode and avoiding them during the test pattern generation process. Existing methods, however, can only extract a small set of illegal states in the system due to various limitations. In this paper, the authors show that illegal states in the system are mainly caused by multi-fan-out nets in the circuit, and they develop efficient and effective heuristics to identify them.