IJCTT-International Journal of Computer Trends and Technology
In this paper, the authors present a new approach to symmetric transparent Built-In Self Test (BIST) for word-oriented RAMs. Transparent Built-In Self Test (BIST) schemes for RAM modules assure the preservation of the memory contents during periodic testing. The proposed concept allows to Skip the signature prediction phase required in traditional transparent BIST schemes, achieving considerable reduction in test time. In this paper, the utilization of accumulator modules for output data compaction in symmetric transparent BIST for RAMs is proposed.