Optimal Periodic Testing of Intermittent Faults In Embedded Pipelined Processor Applications

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Provided by: edaa
Topic: Hardware
Format: PDF
Today's nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability failures that are manifested in the field during the semiconductor product operation. Since Software-Based Self-Test (SBST) has been proposed as an effective strategy for on-line testing of processors integrated in non-safety critical low-cost embedded system applications, optimal test period specification is becoming increasingly challenging. In this paper, the authors first introduce a reliability analysis for optimal periodic testing of intermittent faults that minimizes the test cost incurred based on a two-state Markov model for the probabilistic modeling of intermittent faults.
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