The increasing growth of sub-micron technology has resulted in shrinking of the device size leading to increase in device density. In the modern System-on-Chip (SoC) design, many cores are integrated into a single chip, some of them are embedded. This increases the functional complexity of the chip. The internal sub-circuits of the chip cannot be accessed directly from the primary inputs of the chips. So, the testing of the chip is becoming very time consuming and costly.