Provided by: Science & Engineering Research Support soCiety (SERSC)
Date Added: Dec 2013
RF integrated circuits have grown their usability providing high density, high speed and low-cost RF systems. This paper proposes a new programmable RF Built-In Self-Test (BIST) circuit for 5GHz wireless LAN. It is fabricated using 0.18m SiGe technology. This circuit is useful for testability of GHz-band RF IC devices in a complete RF transceiver environment. The proposed circuit helps it to provide DC output voltages and accurate phase difference. It contains two peak detectors and a phase detector. The proposed circuit showed excellent performance.