Random Test Program Generator for SPARC T1 Processor

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Provided by: Iosrjournals
Topic: Hardware
Format: PDF
As the complexity of the microprocessor design is increasing the verification method is also becoming more and more complex. Unfortunately, it requires a long time to generate and run test sequences. Under the time to market pressure, it is very time consuming to write all test programs manually. This brings about the necessity of developing a random test program generator. The proposed method is for verifying the pre silicon model of the multi-threaded multi-cored processor SPARC T1.
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