Recognition of the Making on Integrated Circuit Chips Based on the Hybrid Fourier-AFMT

Provided by: Global Journals
Topic: Hardware
Format: PDF
In this paper, an automatic optical inspection system incorporating Optical Character Recognition (OCR) is employed to inspect markings on Integrated Circuit (IC) chips. Here, the authors present a novel OCR-based method for character recognition based on the features extracted from the integrated Discrete Wavelet and the hybrid Fourier-AFMT framework (DWFAFMT) which is fast and yields better results as compared to basic Fourier Mellin Transform (FMT). They focus on the computation of a new set of invariant features allowing the classification of multi-oriented and multi-scaled patterns.

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