Reliability Challenges of Real-Time Systems in Forthcoming Technology Nodes

Provided by: edaa
Topic: Hardware
Format: PDF
With the continuous downscaling of CMOS technologies, reliability is more than ever before becoming a major bottleneck due to several reasons. First, the electric fields and current and power densities have increased continuously and are now reaching the maximum values that can be allowed for CMOS reliable operation. Forthcoming technology nodes are posing major challenges on the manufacturing of reliable (real-time) systems: process variations, accelerated degradation aging, as well as external and internal noise are key examples. This paper focuses on real-time systems reliability and analyzes the state-of-the-art and the emerging reliability bottlenecks from three different perspectives: technology, circuit/IP and full system.

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