Reliability Effects of Process and Thread Redundancy on Chip Multiprocessors

The phenomenal performance gains in successive computer technologies have been obtained at the cost of drastic increases in power densities. This fact promoted energy to a first-class system resource, and energy-aware computing has recently become a major research area. At the same time, with the continued scaling of CMOS technologies and reduced design margins, VLSI circuits have become more susceptible to transient faults that are induced by energic particles (e.g., neutrons and alpha particles), and today, reliability concerns are pronounced more strongly for all computing systems.

Provided by: University of Texas at El Paso Topic: Hardware Date Added: Sep 2006 Format: PDF

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